Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography : 19-22 July 1992, San Diego, California
- 責任表示:
- EUV optics for astronomy and projection lithography : 19-22 July 1992, San Diego, California
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 1742
- 出版情報:
- Bellingham, WA: Society of Photo-optical Instrumentation Engineers, 1993
- ISSN:
- 0277786X
- ISBN:
- 9780819409157 [0819409154]
- 請求記号:
- P63600/1742
- 資料種別:
- 国際会議録
類似資料:
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
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Multilayer and grazing incidence X-ray/EUV optics II : 14-16 July 1993, San Diego, California
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EUV, X-ray, and gamma-ray instrumentation for astronomy III : 22-24 July 1992, San Diego, California
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Optics for EUV, x-ray, and gamma-ray astronomy II : 3-4 August 2005, San Diego, California, USA
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