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Soft X-ray microscopy : 19-21 July 1992, San Diego, California

責任表示:
Chris J. Jacobsen, James E. Trebes, chairs
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
1741
出版情報:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers, 1993
ISSN:
0277786X
ISBN:
9780819409140 [0819409146]
請求記号:
P63600/1741
資料種別:
国際会議録
巻号一覧
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