Tests, measurements, and characterization of electro-optic devices and systems, 8 September 1989, Boston, Massachusetts

責任表示:

Shekhar G. Wadekar, chair

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

1180

出版情報:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers, 1990

ISSN:

0277786X

ISBN:

9780819402165 [0819402168]

請求記号:

P63600/1180

資料種別:

国際会議録