Surface characterization and testing II : 10-11 August 1989, San Diego, California | 東京科学大学図書館資料名データベース

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Surface characterization and testing II : 10-11 August 1989, San Diego, California

責任表示:: John E. Greivenkamp, Matt Young, chairs
シリーズ名:: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:: 1164
出版情報:: Bellingham, WA: Society of Photo-optical Instrumentation Engineers, 1989
ISSN:: 0277786X
ISBN:: 9780819402004 [0819402001]
請求記号:: P63600/1164
資料種別:: 国際会議録

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詳細

TDL書誌ID:	ZA00056389
シリーズＩＤ:	PA00000029
会議名:	Symposium on surface characterization and testing
回次:	2nd
会議開催地:	San Diego, CA, USA
会議開催年:	1989.08.10-1989.08.11

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