Test and evaluation of infrared detectors and arrays : 27-29 March 1989, Orlando, Florida

責任表示:

Forney M. Hoke ; sponsored by SPIE -- the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

1108

出版情報:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers, 1989

ISSN:

0277786X

ISBN:

9780819401441 [0819401447]

請求記号:

P63600/1108

資料種別:

国際会議録