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X-ray multilayers for diffractometers, monochromators, and spectrometers : 17-19 August 1988, San Diego, California

責任表示:
Finn E. Christensen, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
984
出版情報:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers, 1988
ISSN:
0277786X
ISBN:
9780819400192 [081940019X]
請求記号:
P63600/984
資料種別:
国際会議録
巻号一覧
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