X-ray multilayers for diffractometers, monochromators, and spectrometers : 17-19 August 1988, San Diego, California
- 責任表示:
- Finn E. Christensen, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 984
- 出版情報:
- Bellingham, WA: Society of Photo-optical Instrumentation Engineers, 1988
- ISSN:
- 0277786X
- ISBN:
- 9780819400192 [081940019X]
- 請求記号:
- P63600/984
- 資料種別:
- 国際会議録
類似資料:
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
2
国際会議録
Multilayer structures and laboratory X-ray laser research : 19-20 August 1986, San Diego, California
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
9
国際会議録
Multilayer and grazing incidence X-ray/EUV optics II : 14-16 July 1993, San Diego, California
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
11
国際会議録
Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |