Advanced processing and characterization of semiconductors III : 22-24 January 1986, Los Angeles, California | 東京工業大学附属図書館資料名データベース

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Advanced processing and characterization of semiconductors III : 22-24 January 1986, Los Angeles, California

責任表示:: Devendra K. Sadana, Michael I. Current, chairmen
シリーズ名:: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:: 623
出版情報:: Bellingham, WA: Society of Photo-optical Instrumentation Engineers, 1986
ISSN:: 0277786X
ISBN:: 9780892526581 [0892526580]
請求記号:: P63600/623
資料種別:: 国際会議録

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詳細

TDL書誌ID:	ZA00055886
シリーズＩＤ:	PA00000029
会議名:	Symposium on advanced processing and characterization of semiconductors
回次:	3rd
会議開催地:	Los Angeles, CA, USA
会議開催年:	1986.01.22-1986.01.24

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