International Conference on Automatic Inspection and Measurement : August 20-21, 1985, San Diego, California

責任表示:

Richard A. Brook, Michael J.W. Chen, chairmen

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

557

出版情報:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers, 1985

ISSN:

0277786X

ISBN:

9780892525928 [0892525924]

請求記号:

P63600/557

資料種別:

国際会議録