Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California | 東京工業大学附属図書館資料名データベース

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Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California

責任表示:: cosponsor Sira Ltd.--The research association for instrumentation ; Lionel R. Baker, Harold E. Bennett, chairmen
シリーズ名:: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:: 525
出版情報:: Bellingham, WA: Society of Photo-optical Instrumentation Engineers, 1985
ISSN:: 0277786X
ISBN:: 9780892525607 [0892525606]
請求記号:: P63600/525
資料種別:: 国際会議録

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詳細

TDL書誌ID:	ZA00055795
シリーズＩＤ:	PA00000029
会議名:	Symposium on measurement and effects of surface defects and quality of polish
回次:	1985
会議開催地:	Los Angeles, CA, USA
会議開催年:	1985.01.21-1985.01.22

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