
Optics in metrology and quality assurance : February 6-7, 1980, Los Angeles, California
- 責任表示:
- Harvey L. Kasdan, editor ; presented in cooperation with the Los Angeles Section, American Society for Quality Control
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 220
- 出版情報:
- Washington, D.C.: Society of Photo-optical Instrumentation Engineers, 1980
- ISSN:
- 03610748
- ISBN:
- 9780892522484 [0892522488]
- 請求記号:
- P63600/220
- 資料種別:
- 国際会議録
類似資料:
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
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![]() Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |