2nd European Congress on Optics Applied to Metrology (METROP) : presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France

2nd European Congress on Optics Applied to Metrology (METROP) : presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France

責任表示:: editors, Michel Grosmann, Patrick Meyrueis ; organized by European Photonics Association in collaboration with the Society of Photo-optical Instrumentation Engineers
シリーズ名:: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:: 210
出版情報:: Washington, D.C.: Society of Photo-optical Instrumentation Engineers, 1980
ISSN:: 03610748
ISBN:: 9780892522385 [0892522380]
請求記号:: P63600/210
資料種別:: 国際会議録

巻号一覧

詳細

TDL書誌ID:	ZA00055488
シリーズＩＤ:	PA00000029
会議名:	European Congress on Optics Applied to Metrology (METROP)
回次:	2nd
会議開催地:	Strasbourg, France
会議開催年:	1979.11.26-1979.11.30

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