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Advances in optical metrology : August 28-29, 1978, San Diego, California

責任表示:
N. Balasubramanian, James C. Wyant, editors
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
153
出版情報:
Washington, D.C.: Society of Photo-optical Instrumentation Engineers, 1978
ISSN:
03610748
ISBN:
9780892521807 [0892521805]
請求記号:
P63600/153
資料種別:
国際会議録
巻号一覧
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