Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011, Miyazaki, Japan

責任表示:

edited by Hiroshi Yamada-Kaneta, Akira Sakai

シリーズ名:

Materials science forum

シリーズ巻号:

725

出版情報:

Aedermannsdorf, Switzerland: Trans Tech Publications, 2012

ISSN:

02555476

請求記号:

M23650

資料種別:

国際会議録