Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China | 東京工業大学附属図書館資料名データベース

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Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China

責任表示:: edited by Yanwen Wu
シリーズ名:: Key engineering materials
シリーズ巻号:: 439-440
出版情報:: Aedermannsdorf, Switzerland: Trans Tech Publications, 2010
ISSN:: 10139826
請求記号:: K32200
資料種別:: 国際会議録

巻号一覧

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詳細

TDL書誌ID:	ZA00053919
シリーズＩＤ:	PA00000253
会議名:	International Conference on Advanced Measurement and Test (AMT 2010)
回次:	2010
会議開催地:	Sanya, P.R. China
会議開催年:	2010.05.15-2010.05.16

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