Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China

責任表示:

edited by Prasad Yarlagadda and Yun-Hae Kim

シリーズ名:

Applied mechanics and materials

シリーズ巻号:

568-570

出版情報:

Stafa-Zuerich: Trans Tech Publications, 2014

ISSN:

16609336

ISBN:

9783038351382 [3038351385]

請求記号:

A69500/568

資料種別:

国際会議録