Blank Cover Image

Design, manufacturing, and testing of micro- and nano-optical devices and systems : 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies : 19-21 November 2008, Chengdu, China

責任表示:
Sen Han, Masaomi Kameyama, Xiangang Luo, editors ; sponsored by COS--the Chinese Optical Society (China) [and] IOE--the Institute of Optics and Electronics, CAS (China) ; technical cosponsor, SPIE ; cosponsoring organizations, State Key Laboratory of Optical Technology for Microfabrication (China) [and] SOS--Sichuan Optical Society (China) ; cooperating organization, Committee of Optical Manufacturing Technology, COS (China) ; supporting organizations, Ministry of Science and Technology of China (China), Chinese Academy of Sciences (CAS), National Natural Science Foundation of China (NSFC)
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
7284
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers, 2009
ISSN:
0277786X
ISBN:
9780819475442 [0819475440]
請求記号:
P63600/7284
資料種別:
国際会議録
巻号一覧
Loading volume number list

類似資料:

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12