Optoelectronic measurement technology and applications : 2008 International Conference on Optical Instruments and Technology : 16-19 November 2008, Beijing, China

責任表示:

Shenghua Ye, Guangjun Zhang, Jun Ni, editors ; sponsored by CIS--China Instrument and Control Society [and] SPIE ; cooperating organizations, Optoelectronic-Mechanic Technology and System Integration Chapter, CIS (China) ... [et al.] ; supporting organizations, China Association for Science and Technology ... [et al.]

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

7160

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers, 2009

ISSN:

0277786X

ISBN:

9780819474049 [0819474045]

請求記号:

P63600/7160

資料種別:

国際会議録