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Optical fabrication, testing, and metrology III : 2-4 September 2008, Glasgow, United Kingdom

責任表示:
Angela Duparré, Roland Geyl, editors ; sponsored by SPIE Europe ; cosponsored by Scottish Optoelectronic Association (United Kingdom) ; cooperating organisations, EFDS--Europäische Forschungsgesellschaft Dünne Schichten e.V. (Germany) ... [et al.]
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
7102
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers, 2008
ISSN:
0277786X
ISBN:
9780819473325 [0819473324]
請求記号:
P63600/7102
資料種別:
国際会議録
巻号一覧
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