Interferometry XIV : techniques and analysis : 11-13 August 2008, San Diego, California, USA

責任表示:

Joanna Schmit, Katherine Creath, Catherine E. Towers, editors ; sponsored and published by SPIE

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

7063

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers, 2008

ISSN:

0277786X

ISBN:

9780819472830 [0819472832]

請求記号:

P63600/7063

資料種別:

国際会議録