Blank Cover Image

Scanning tunneling microscopy and related methods : [proceedings of the NATO Advanced Study Institute on Basic Concepts and Applications of Scanning Tunneling Microscopy, Erice, Italy, April 17-29, 1989]

責任表示:
edited by R.J. Behm, N. Garcia, H. Rohrer
シリーズ名:
NATO ASI series. Series E, Applied sciences
シリーズ巻号:
184
出版情報:
Dordrecht: Kluwer Academic Publishers, 1990
ISSN:
0168132X
ISBN:
9780792308614 [0792308611]
請求記号:
N11482/184
資料種別:
国際会議録
巻号一覧
Loading volume number list

類似資料:

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12