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Defects in Semiconductors : Proceedings of the 14th International Conference on Defects in Semiconductors, ICDS-14, Paris, France, August 18-22, 1986

責任表示:
edited by H. J. von Berdeleben
シリーズ名:
Materials science forum
シリーズ巻号:
10-12
出版情報:
Aedermannsdorf, Switzerland: Trans Tech Publications, 1986
ISSN:
02555476
ISBN:
9780878495511 [0878495517]
請求記号:
M23650
資料種別:
国際会議録
巻号一覧
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