Impact of electron and scanning probe microscopy on materials research
- 責任表示:
- edited by David G. Rickerby, Giovanni Valdrè and Ugo Valdrè
- シリーズ名:
- NATO ASI series. Series E, Applied sciences
- シリーズ巻号:
- 364
- 出版情報:
- Dordrecht: Kluwer Academic Publishers, 1999
- ISSN:
- 0168132X
- ISBN:
- 9780792359395 [0792359399]
- 請求記号:
- N11482/364
- 資料種別:
- 国際会議録
類似資料:
American Chemical Society | |
Kluwer Academic Publishers |
Society of Photo-optical Instrumentation Engineers |
American Chemical Society |
Electrochemical Society |
American Institute of Physics |
Plenum Press |
Electrochemical Society |
Kluwer Academic Publishers |
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |