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Impact of electron and scanning probe microscopy on materials research

責任表示:
edited by David G. Rickerby, Giovanni Valdrè and Ugo Valdrè
シリーズ名:
NATO ASI series. Series E, Applied sciences
シリーズ巻号:
364
出版情報:
Dordrecht: Kluwer Academic Publishers, 1999
ISSN:
0168132X
ISBN:
9780792359395 [0792359399]
請求記号:
N11482/364
資料種別:
国際会議録
巻号一覧
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類似資料:

American Chemical Society

Society of Photo-optical Instrumentation Engineers

American Chemical Society

American Institute of Physics

Society of Photo-optical Instrumentation Engineers

Kluwer Academic Publishers

Society of Photo-optical Instrumentation Engineers

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