Recent advances in metrology, characterization, and standards for optical digital data disks : 21-22 July 1999, Denver, Colorado

責任表示:

[Fernando Luis Podio, chair

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3806

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering, 1999

ISSN:

0277786X

ISBN:

9780819432926 [081943292X]

請求記号:

P63600/3806

資料種別:

国際会議録