Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991

責任表示:

edited by Gordon Davies, Gary G. DeLeo and Michael Stavola

シリーズ名:

Materials science forum

シリーズ巻号:

83-87

出版情報:

Zurich, Switzerland: Trans Tech Publications, 1992

ISSN:

02555476

ISBN:

9780878496280 [0878496289]

請求記号:

M23650

資料種別:

国際会議録