Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV
- 責任表示:
- Prasad
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3510
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering, 1998
- ISSN:
- 0277786X
- ISBN:
- 9780819429698 [0819429694]
- 請求記号:
- P63600/3510
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
ASM International |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
9
国際会議録
Microelectronics manufacturability, yield, and reliability : 20-21 October 1994, Austin, Texas
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
American Society of Mechanical Engineers |
SPIE-The International Society for Optical Engineering |
American Society of Mechanical Engineers |