Testing and diagnosis of VLSI and ULSI
- 責任表示:
- edited by Fabrizio Lombardi and Mariagiovanna Sami
- シリーズ名:
- NATO ASI series. Series E, Applied sciences
- シリーズ巻号:
- 151
- 出版情報:
- Dordrecht: Kluwer Academic Publishers, 1988
- ISSN:
- 0168132X
- ISBN:
- 9789024737949 [902473794X]
- 請求記号:
- N11482/151
- 資料種別:
- 国際会議録
類似資料:
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
Martinus Nijhoff Publishers |
Plenum Press |
Electrochemical Society |
SPIE - The International Society of Optical Engineering |
Electrochemical Society |
SPIE - The International Society of Optical Engineering |
Sijthoff & Noordhoff International Publisher |
Sijthoff & Noordhoff International Publishers |
Kluwer Academic Publishers |