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Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California

責任表示:
Kenneth W. Tobin, Jr., chair
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3966
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering, 2000
ISSN:
0277786X
ISBN:
9780819435842 [0819435848]
請求記号:
P63600/3966
資料種別:
国際会議録
巻号一覧
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