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Targets and backgrounds VI : characterization, visualization, and the detection process : 24-26 April 2000, Orlando, USA

責任表示:
Wendell R. Watkins, Dieter Clement, William R. Reynolds, chairs
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4029
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering, 2000
ISSN:
0277786X
ISBN:
9780819436559 [0819436550]
請求記号:
P63600/4029
資料種別:
国際会議録
巻号一覧
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類似資料:

SPIE - The International Society for Optical Engineering

Society of Photo-optical Instrumentation Engineers

SPIE - The International Society for Optical Engineering

SPIE - The International Society for Optical Engineering

SPIE - The International Society for Optical Engineering

SPIE-The International Society for Optical Engineering

SPIE - The International Society for Optical Engineering

SPIE-The International Society for Optical Engineering

SPIE - The International Society of Optical Engineering

SPIE-The International Society for Optical Engineering

SPIE - The International Society for Optical Engineering

SPIE-The International Society for Optical Engineering

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