Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California | 東京工業大学附属図書館資料名データベース

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Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California

責任表示:: Geoffrey T. Burnham...[et al.], chairs
シリーズ名:: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:: 3945
出版情報:: Bellingham, Wash.: SPIE - The International Society for Optical Engineering, 2000
ISSN:: 0277786X
ISBN:: 9780819435620 [0819435627]
請求記号:: P63600/3945
資料種別:: 国際会議録

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詳細

TDL書誌ID:	ZA00018566
シリーズＩＤ:	PA00000029
会議名:	Photonics West - Optoelectronic Materials and Devices : Laser diodes and leds in industrial, measurement, imaging, and sensors applications ; Testing, packaging, and reliability of semiconductor lasers
回次:	2000 : 2nd ; 5th
会議開催地:	San Jose, CA, USA
会議開催年:	2000.01.25-2000.01.26

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