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Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado

責任表示:
Philip T. C. Chen, Zu-Han Gu, Alexei A. Maradudin, chairs
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3784
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering, 1999
ISSN:
0277786X
ISBN:
9780819432704 [0819432709]
請求記号:
P63600/3784
資料種別:
国際会議録
巻号一覧
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