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Ultraviolet and x-ray detection, spectroscopy and polarimetry III : 19-20 July 1999, Denver, Colorado

責任表示:
Silvano Fineschi, Bruce E. Woodgate, Randy A. Kimble, chairs
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3764
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering, 1999
ISSN:
0277786X
ISBN:
9780819432506 [0819432504]
請求記号:
P63600/3764
資料種別:
国際会議録
巻号一覧
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類似資料:

SPIE - The International Society for Optical Engineering

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Society of Photo-optical Instrumentation Engineers

SPIE - The International Society for Optical Engineering

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