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Optoelectronic metrology : 28-30 September 1998, Ĺańcut, Poland

責任表示:
Jan Owsik, Tomasz Więcek,editors ; Wojciech Skrzeczanowski, Ewa Burdziakowska, co-editors ; organized by Institute of Optoelectronics, Military University of Technology, Warsaw(Poland), Central Office of Measures, Warsaw(Poland), Foundation for Industrial and Environmental Science, Rzeszów(Poland)
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4018
出版情報:
Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering, 1998
ISSN:
0277786X
ISBN:
9780819436443 [0819436445]
請求記号:
P63600/4018
資料種別:
国際会議録
巻号一覧
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