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Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A.

責任表示:
editors, J. Joseph Clement ... [et al.]
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
473
出版情報:
Pittsburgh, Pa.: MRS - Materials Research Society, 1997
ISSN:
02729172
ISBN:
9781558993778 [1558993770]
請求記号:
M23500/473
資料種別:
国際会議録
巻号一覧
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