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Pattern recognition, chemometrics, and imaging for optical environmental monitoring : 20-21 September 1999, Boston, Massahcusetts

責任表示:
Khalid J. Siddiqui, Delyle Eastwood, chairs
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3854
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering, 1999
ISSN:
0277786X
ISBN:
9780819434470 [0819434477]
請求記号:
P63600/3854
資料種別:
国際会議録
巻号一覧
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類似資料:

SPIE - The International Society for Optical Engineering

Society of Photo-optical Instrumentation Engineers

SPIE - The International Society for Optical Engineering

SPIE - The International Society for Optical Engineering

SPIE - The International Society for Optical Engineering

SPIE - The International Society for Optical Engineering

SPIE - The International Society for Optical Engineering

SPIE - The International Society for Optical Engineering

Society of Photo-optical Instrumentation Engineers

12 国際会議録 Optical pattern recognition XIX

Society of Photo-optical Instrumentation Engineers

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