Micro-optical technologies for measurement, sensors, and microsystems : 12-13 June 1996, Besançon, France
- 責任表示:
- Olivier M. Parriaux chairs
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2783
- 出版情報:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering, 1996
- ISSN:
- 0277786X
- ISBN:
- 9780819421692 [0819421693]
- 請求記号:
- P63600/2783
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
7
国際会議録
Optical measurements and sensors for the process industries : 20-22 June 1994, Frankfurt, FRG
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SPIE-The International Society for Optical Engineering | |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
4
国際会議録
Optical micro- and nanometrology in microsystems technology II : 8-10 April 2008, Strasbourg, France
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SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
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SPIE - The International Society of Optical Engineering |
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