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Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A.

責任表示:
editors, William F. Filter ... [et al.]
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
428
出版情報:
Pittsburgh, Pa.: MRS - Materials Research Society, 1996
ISSN:
02729172
ISBN:
9781558993310 [1558993312]
請求記号:
M23500/428
資料種別:
国際会議録
巻号一覧
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