Process and device modeling for integrated circuit design : [proceedings of the NATO Advanced Study Institute on Process and device modeling for integrated circuit design, Louvain-la-Neuve, Belgium, July 19-29, 1977]

責任表示:

edited by Fernand van de Wiele, Walter L. Engl. Paul G. Jespers

シリーズ名:

NATO ASI series. Series E, Applied sciences

シリーズ巻号:

21

出版情報:

Leyden: Noordhoff International Publishing, 1977

ISSN:

0168132X

ISBN:

9789028606678 [902860667X]

請求記号:

N11482/21

資料種別:

国際会議録