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Scanning and force microscopies for biomedical applications : 23-24 January 2000, San Jose, California

責任表示:
Shuming Nie, Eiichi Tamiya, Edward S. Yeung, chairs
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3922
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering, 2000
ISSN:
0277786X
ISBN:
9780819435385 [0819435384]
請求記号:
P63600/3922
資料種別:
国際会議録
巻号一覧
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