Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts
- 責任表示:
- John Hicks, Peter R. De Forest, Vivian M. Baylor, chairs
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2941
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering, 1997
- ISSN:
- 0277786X
- ISBN:
- 9780819423436 [0819423432]
- 請求記号:
- P63600/2941
- 資料種別:
- 国際会議録
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