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Non-intrusive inspection technologies : 17-18 April 2006, Kissimmee, Florida, USA

責任表示:
George Vourvopoulos, F. Patrick Doty, chairs
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6213
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering, 2006
ISSN:
0277786X
ISBN:
9780819462695 [0819462691]
請求記号:
P63600/6213
資料種別:
国際会議録
巻号一覧
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類似資料:

SPIE - The International Society of Optical Engineering

SPIE - The International Society of Optical Engineering

SPIE - The International Society of Optical Engineering

SPIE - The International Society of Optical Engineering

SPIE - The International Society of Optical Engineering

SPIE - The International Society of Optical Engineering

SPIE - The International Society of Optical Engineering

SPIE - The International Society of Optical Engineering

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