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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V

責任表示:
MOEMS V
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6111
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering, 2006
ISSN:
0277786X
ISBN:
9780819461537 [0819461539]
請求記号:
P63600/6111
資料種別:
国際会議録
巻号一覧
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