Image quality and system performance III : 17-19 January, 2006, San Jose, California, USA | 東京工業大学附属図書館資料名データベース

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Image quality and system performance III : 17-19 January, 2006, San Jose, California, USA

責任表示:: Luke C. Cui, Yoichi Miyake, chairs
シリーズ名:: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:: 6059
出版情報:: Bellingham, Wash.: SPIE - The International Society of Optical Engineering, 2006
ISSN:: 0277786X
ISBN:: 9780819460998 [0819460990]
請求記号:: P63600/6059
資料種別:: 国際会議録

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詳細

TDL書誌ID:	ZA00016093
シリーズＩＤ:	PA00000029
会議名:	IS&T/SPIE Electronic Imaging : Image quality and system performance
回次:	2006 : 3rd
会議開催地:	San Jose, CA, USA
会議開催年:	2006.01.17-2006.01.19

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