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Advanced sensor technologies for nondestructive evaluation and structural health monitoring II : 1-2 March 2006, San Diego, California, USA

責任表示:
Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6179
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering, 2006
ISSN:
0277786X
ISBN:
9780819462329 [0819462322]
請求記号:
P63600/6179
資料種別:
国際会議録
巻号一覧
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