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Nonintrusive inspection, structures monitoring, and smart systems for homeland security : 27-28 February 2006, San Diego, California, USA

責任表示:
Aaron A. Diaz ... [et al.] , chairs
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6178
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering, 2006
ISSN:
0277786X
ISBN:
9780819462312 [0819462314]
請求記号:
P63600/6178
資料種別:
国際会議録
巻号一覧
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類似資料:

SPIE - The International Society of Optical Engineering

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