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Atomic-scale imaging of surfaces and interfaces : symposium held November 30-December 2, 1992, Boston, Massachusetts, U.S.A.

責任表示:
editors, David K. Biegelsen, David J. Smith, S.Y. Tong
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
295
出版情報:
Pittsburgh, Pa.: Materials Research Society, 1993
ISSN:
02729172
ISBN:
9781558991903 [1558991905]
請求記号:
M23500/295
資料種別:
国際会議録
巻号一覧
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