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Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A.

責任表示:
editors: C.V. Thompson, J.R. Lloyd
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
265
出版情報:
Pittsburgh, PA: Materials Research Society, 1992
ISSN:
02729172
ISBN:
9781558991606 [1558991603]
請求記号:
M23500/265
資料種別:
国際会議録
巻号一覧
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