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Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.

責任表示:
editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
225
出版情報:
Pittsburgh, Pa.: Materials Research Society, 1991
ISSN:
02729172
ISBN:
9781558991194 [1558991190]
請求記号:
M23500/225
資料種別:
国際会議録
巻号一覧
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MRS - Materials Research Society
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