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High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA

責任表示:
editors, Robert Sinclair, David J. Smith, Ulrich Dahmen
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
183
出版情報:
Pittsburgh, Pa.: Materials Research Society, 1990
ISSN:
02729172
ISBN:
9781558990722 [1558990720]
請求記号:
M23500/183
資料種別:
国際会議録
巻号一覧
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