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Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A.

責任表示:
editors, Richard W. Siegel, Julia R. Weertman, Robert Sinclair
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
82
出版情報:
Pittsburgh, Pa.: Materials Research Society, 1987
ISSN:
02729172
ISBN:
9780931837470 [0931837472]
請求記号:
M23500/82
資料種別:
国際会議録
巻号一覧
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