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Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.

責任表示:
editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
46
出版情報:
Pittsburgh, Pa.: Materials Research Society, 1985
ISSN:
02729172
ISBN:
9780931837111 [0931837111]
請求記号:
M23500/46
資料種別:
国際会議録
巻号一覧
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